International On-Line Testing Symposium: Crete, Greece - 2007

• Autore: IEEE Computer Society
• Pubblicazione: [Place of publication not identified], : IEEE Computer Society Press, 2007
• Descrizione fisica: 1 online resource : illustrations
• Disciplina: 621.3815
• Soggetto topico: Electronic circuits - Testing - Data processing; Error-correcting codes (Information theory)
• Note generali: Bibliographic Level Mode of Issuance: Monograph
• Nota di contenuto: 13th IEEE International On-Line Testing Symposium - Cover -- 13th IEEE International On-Line Testing Symposium-Title -- 13th IEEE International On-Line Testing Symposium-Copyright -- 13th IEEE International On-Line Testing Symposium - TOC -- Message from the General Co-Chairs and the Program Co-Chairs -- Organizing Committee -- Program Committee -- IEEE Computer Society TTTC: Test Technology Technical Council -- Soft Errors: Technology Trends, System Effects, and Protection Techniques -- Soft-Errors Phenomenon Impacts on Design for Reliability Technologies -- Accelerating Yield Ramp through Real-Time Testing -- Fuse: A Technique to Anticipate Failures due to Degradation in ALUs -- Design for Resilience to Soft Errors and Variations -- Defect-Aware Configurable Computing in Nanoscale Crossbar for Improved Yield -- Essential Fault-Tolerance Metrics for NoC Infrastructures -- Configurable Error Control Scheme for NoC Signal Integrity -- An Analytical Model for Reliability Evaluation of NoC Architectures -- An On-Line Fault Detection Scheme for SBoxes in Secure Circuits.
• Titolo autorizzato: International On-Line Testing Symposium: Crete, Greece - 2007
• ISBN: 9781509083312; 1509083316
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910142715803321
• Lo trovi qui: Univ. Federico II