02574oam 2200457zu 450 991014271580332120241212215505.097815090833121509083316(CKB)1000000000331081(SSID)ssj0000445293(PQKBManifestationID)12175673(PQKBTitleCode)TC0000445293(PQKBWorkID)10484900(PQKB)11386493(NjHacI)991000000000331081(EXLCZ)99100000000033108120160829d2007 uy engur|||||||||||txtccrInternational On-Line Testing Symposium: Crete, Greece - 2007[Place of publication not identified]IEEE Computer Society Press20071 online resource illustrationsBibliographic Level Mode of Issuance: Monograph9780769529189 0769529186 13th IEEE International On-Line Testing Symposium - Cover -- 13th IEEE International On-Line Testing Symposium-Title -- 13th IEEE International On-Line Testing Symposium-Copyright -- 13th IEEE International On-Line Testing Symposium - TOC -- Message from the General Co-Chairs and the Program Co-Chairs -- Organizing Committee -- Program Committee -- IEEE Computer Society TTTC: Test Technology Technical Council -- Soft Errors: Technology Trends, System Effects, and Protection Techniques -- Soft-Errors Phenomenon Impacts on Design for Reliability Technologies -- Accelerating Yield Ramp through Real-Time Testing -- Fuse: A Technique to Anticipate Failures due to Degradation in ALUs -- Design for Resilience to Soft Errors and Variations -- Defect-Aware Configurable Computing in Nanoscale Crossbar for Improved Yield -- Essential Fault-Tolerance Metrics for NoC Infrastructures -- Configurable Error Control Scheme for NoC Signal Integrity -- An Analytical Model for Reliability Evaluation of NoC Architectures -- An On-Line Fault Detection Scheme for SBoxes in Secure Circuits.Electronic circuitsTestingData processingCongressesError-correcting codes (Information theory)CongressesElectronic circuitsTestingData processingError-correcting codes (Information theory)621.3815IEEE Computer Society1847563PQKBPROCEEDING9910142715803321International On-Line Testing Symposium: Crete, Greece - 20074433401UNINA