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[null,"1.","Record Nr.",null,"UNINA9910142715803321"]
[null,null,"Autore",null,"IEEE Computer Society"]
[null,null,"Titolo",null,"International On-Line Testing Symposium: Crete, Greece - 2007"]
[null,null,"Pubbl/distr/stampa",null,"[Place of publication not identified], : IEEE Computer Society Press, 2007"]
[null,null,"ISBN",null,"9781509083312"]
[{"$nulls":4},"1509083316"]
[null,null,"Descrizione fisica",null,"1 online resource : illustrations"]
[null,null,"Disciplina",null,"621.3815"]
[null,null,"Soggetti",null,"Electronic circuits - Testing - Data processing"]
[{"$nulls":4},"Error-correcting codes (Information theory)"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]
[null,null,"Nota di contenuto",null,"13th IEEE International On-Line Testing Symposium - Cover -- 13th IEEE International On-Line Testing Symposium-Title -- 13th IEEE International On-Line Testing Symposium-Copyright -- 13th IEEE International On-Line Testing Symposium - TOC -- Message from the General Co-Chairs and the Program Co-Chairs -- Organizing Committee -- Program Committee -- IEEE Computer Society TTTC: Test Technology Technical Council -- Soft Errors: Technology Trends, System Effects, and Protection Techniques -- Soft-Errors Phenomenon Impacts on Design for Reliability Technologies -- Accelerating Yield Ramp through Real-Time Testing -- Fuse: A Technique to Anticipate Failures due to Degradation in ALUs -- Design for Resilience to Soft Errors and Variations -- Defect-Aware Configurable Computing in Nanoscale Crossbar for Improved Yield -- Essential Fault-Tolerance Metrics for NoC Infrastructures -- Configurable Error Control Scheme for NoC Signal Integrity -- An Analytical Model for Reliability Evaluation of NoC Architectures -- An On-Line Fault Detection Scheme for SBoxes in Secure Circuits."]