LEADER 02574oam 2200457zu 450 001 9910142715803321 005 20241212215505.0 010 $a9781509083312 010 $a1509083316 035 $a(CKB)1000000000331081 035 $a(SSID)ssj0000445293 035 $a(PQKBManifestationID)12175673 035 $a(PQKBTitleCode)TC0000445293 035 $a(PQKBWorkID)10484900 035 $a(PQKB)11386493 035 $a(NjHacI)991000000000331081 035 $a(EXLCZ)991000000000331081 100 $a20160829d2007 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aInternational On-Line Testing Symposium: Crete, Greece - 2007 210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d2007 215 $a1 online resource $cillustrations 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9780769529189 311 08$a0769529186 327 $a13th IEEE International On-Line Testing Symposium - Cover -- 13th IEEE International On-Line Testing Symposium-Title -- 13th IEEE International On-Line Testing Symposium-Copyright -- 13th IEEE International On-Line Testing Symposium - TOC -- Message from the General Co-Chairs and the Program Co-Chairs -- Organizing Committee -- Program Committee -- IEEE Computer Society TTTC: Test Technology Technical Council -- Soft Errors: Technology Trends, System Effects, and Protection Techniques -- Soft-Errors Phenomenon Impacts on Design for Reliability Technologies -- Accelerating Yield Ramp through Real-Time Testing -- Fuse: A Technique to Anticipate Failures due to Degradation in ALUs -- Design for Resilience to Soft Errors and Variations -- Defect-Aware Configurable Computing in Nanoscale Crossbar for Improved Yield -- Essential Fault-Tolerance Metrics for NoC Infrastructures -- Configurable Error Control Scheme for NoC Signal Integrity -- An Analytical Model for Reliability Evaluation of NoC Architectures -- An On-Line Fault Detection Scheme for SBoxes in Secure Circuits. 606 $aElectronic circuits$xTesting$xData processing$vCongresses 606 $aError-correcting codes (Information theory)$vCongresses 615 0$aElectronic circuits$xTesting$xData processing 615 0$aError-correcting codes (Information theory) 676 $a621.3815 700 $aIEEE Computer Society$01847563 801 0$bPQKB 906 $aPROCEEDING 912 $a9910142715803321 996 $aInternational On-Line Testing Symposium: Crete, Greece - 2007$94433401 997 $aUNINA