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Record Nr. |
UNINA9910142715803321 |
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Autore |
IEEE Computer Society |
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Titolo |
International On-Line Testing Symposium: Crete, Greece - 2007 |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE Computer Society Press, 2007 |
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ISBN |
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Descrizione fisica |
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1 online resource : illustrations |
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Disciplina |
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Soggetti |
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Electronic circuits - Testing - Data processing |
Error-correcting codes (Information theory) |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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Nota di contenuto |
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13th IEEE International On-Line Testing Symposium - Cover -- 13th IEEE International On-Line Testing Symposium-Title -- 13th IEEE International On-Line Testing Symposium-Copyright -- 13th IEEE International On-Line Testing Symposium - TOC -- Message from the General Co-Chairs and the Program Co-Chairs -- Organizing Committee -- Program Committee -- IEEE Computer Society TTTC: Test Technology Technical Council -- Soft Errors: Technology Trends, System Effects, and Protection Techniques -- Soft-Errors Phenomenon Impacts on Design for Reliability Technologies -- Accelerating Yield Ramp through Real-Time Testing -- Fuse: A Technique to Anticipate Failures due to Degradation in ALUs -- Design for Resilience to Soft Errors and Variations -- Defect-Aware Configurable Computing in Nanoscale Crossbar for Improved Yield -- Essential Fault-Tolerance Metrics for NoC Infrastructures -- Configurable Error Control Scheme for NoC Signal Integrity -- An Analytical Model for Reliability Evaluation of NoC Architectures -- An On-Line Fault Detection Scheme for SBoxes in Secure Circuits. |
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