Exploring scanning probe microscopy with mathematica / / Dror Sarid
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| Autore: |
Sarid Dror
|
| Titolo: |
Exploring scanning probe microscopy with mathematica / / Dror Sarid
|
| Pubblicazione: | Weinheim, [Germany] : , : Wiley-VCH Verlag GmbH & Co. KGaA, , 2007 |
| ©2007 | |
| Edizione: | 2nd ed. |
| Descrizione fisica: | 1 online resource (312 p.) |
| Disciplina: | 502.82 |
| Soggetto topico: | Scanning probe microscopy - Data processing |
| Note generali: | Description based upon print version of record. |
| Nota di bibliografia: | Includes bibliographical references at the end of each chapters and index. |
| Nota di contenuto: | Exploring Scanning Probe Microscopy with MATHEMATICA; Contents; Preface; 1 Introduction; 1.1 Style; 1.2 Mathematica Preparation; 1.2.1 General; 1.2.2 Example; 1.3 Recommended Books; 1.3.1 Mathematica Programming Language; 1.3.2 Scanning Probe Microscopies; 2 Uniform Cantilevers; 2.1 Introduction; 2.2 Bending Due to F(z); 2.2.1 General Equations; 2.2.2 Slope; 2.2.3 Angular Spring Constant; 2.2.4 Displacement; 2.2.5 Linear Spring Constant; 2.2.6 Numerical Example: Si; 2.2.7 Numerical Example: PtIr; 2.3 Buckling Due to F(x); 2.3.1 General Equations; 2.3.2 Slope; 2.3.3 Angular Spring Constant |
| 4.1 Introduction4.2 Bending Due to F(z): Triangular Shape; 4.2.1 General Equations; 4.2.2 Slope; 4.2.3 Angular Spring Constant; 4.2.4 Displacement; 4.2.5 Linear Spring Constant; 4.2.6 Numerical Examples; 4.3 Buckling due to F(x): Triangular Shape; 4.3.1 General Equations; 4.3.2 Slope; 4.3.3 Angular Spring Constant; 4.3.4 Displacement; 4.3.5 Linear Spring Constant; 4.3.6 Numerical Examples; 4.4 Bending due to F(z): V Shape; 4.4.1 General Equations; 4.4.2 Slope; 4.4.3 Angular Spring Constant; 4.4.4 Displacement; 4.4.5 Linear Spring Constant; 4.4.6 Numerical Examples | |
| 6.2 Tip-Sample Interaction | |
| Sommario/riassunto: | This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, |
| Titolo autorizzato: | Exploring scanning probe microscopy with mathematica |
| ISBN: | 1-280-85452-9 |
| 9786610854523 | |
| 3-527-61006-5 | |
| 3-527-60987-3 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910829932503321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |