03428nam 2200565 450 991082993250332120230721030223.01-280-85452-997866108545233-527-61006-53-527-60987-3(CKB)1000000000377363(EBL)482262(OCoLC)123965357(SSID)ssj0000152345(PQKBManifestationID)11165151(PQKBTitleCode)TC0000152345(PQKBWorkID)10339821(PQKB)10966805(MiAaPQ)EBC482262(EXLCZ)99100000000037736320160816h20072007 uy 0engur|n|---|||||txtccrExploring scanning probe microscopy with mathematica /Dror Sarid2nd ed.Weinheim, [Germany] :Wiley-VCH Verlag GmbH & Co. KGaA,2007.©20071 online resource (312 p.)Description based upon print version of record.3-527-40617-4 Includes bibliographical references at the end of each chapters and index.Exploring Scanning Probe Microscopy with MATHEMATICA; Contents; Preface; 1 Introduction; 1.1 Style; 1.2 Mathematica Preparation; 1.2.1 General; 1.2.2 Example; 1.3 Recommended Books; 1.3.1 Mathematica Programming Language; 1.3.2 Scanning Probe Microscopies; 2 Uniform Cantilevers; 2.1 Introduction; 2.2 Bending Due to F(z); 2.2.1 General Equations; 2.2.2 Slope; 2.2.3 Angular Spring Constant; 2.2.4 Displacement; 2.2.5 Linear Spring Constant; 2.2.6 Numerical Example: Si; 2.2.7 Numerical Example: PtIr; 2.3 Buckling Due to F(x); 2.3.1 General Equations; 2.3.2 Slope; 2.3.3 Angular Spring Constant4.1 Introduction4.2 Bending Due to F(z): Triangular Shape; 4.2.1 General Equations; 4.2.2 Slope; 4.2.3 Angular Spring Constant; 4.2.4 Displacement; 4.2.5 Linear Spring Constant; 4.2.6 Numerical Examples; 4.3 Buckling due to F(x): Triangular Shape; 4.3.1 General Equations; 4.3.2 Slope; 4.3.3 Angular Spring Constant; 4.3.4 Displacement; 4.3.5 Linear Spring Constant; 4.3.6 Numerical Examples; 4.4 Bending due to F(z): V Shape; 4.4.1 General Equations; 4.4.2 Slope; 4.4.3 Angular Spring Constant; 4.4.4 Displacement; 4.4.5 Linear Spring Constant; 4.4.6 Numerical Examples6.2 Tip-Sample InteractionThis new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy,Scanning probe microscopyData processingScanning probe microscopyData processing.502.82Sarid Dror745994MiAaPQMiAaPQMiAaPQBOOK9910829932503321Exploring scanning probe microscopy with mathematica3976349UNINA