LEADER 03428nam 2200565 450 001 9910829932503321 005 20230721030223.0 010 $a1-280-85452-9 010 $a9786610854523 010 $a3-527-61006-5 010 $a3-527-60987-3 035 $a(CKB)1000000000377363 035 $a(EBL)482262 035 $a(OCoLC)123965357 035 $a(SSID)ssj0000152345 035 $a(PQKBManifestationID)11165151 035 $a(PQKBTitleCode)TC0000152345 035 $a(PQKBWorkID)10339821 035 $a(PQKB)10966805 035 $a(MiAaPQ)EBC482262 035 $a(EXLCZ)991000000000377363 100 $a20160816h20072007 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aExploring scanning probe microscopy with mathematica /$fDror Sarid 205 $a2nd ed. 210 1$aWeinheim, [Germany] :$cWiley-VCH Verlag GmbH & Co. KGaA,$d2007. 210 4$dİ2007 215 $a1 online resource (312 p.) 300 $aDescription based upon print version of record. 311 $a3-527-40617-4 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aExploring Scanning Probe Microscopy with MATHEMATICA; Contents; Preface; 1 Introduction; 1.1 Style; 1.2 Mathematica Preparation; 1.2.1 General; 1.2.2 Example; 1.3 Recommended Books; 1.3.1 Mathematica Programming Language; 1.3.2 Scanning Probe Microscopies; 2 Uniform Cantilevers; 2.1 Introduction; 2.2 Bending Due to F(z); 2.2.1 General Equations; 2.2.2 Slope; 2.2.3 Angular Spring Constant; 2.2.4 Displacement; 2.2.5 Linear Spring Constant; 2.2.6 Numerical Example: Si; 2.2.7 Numerical Example: PtIr; 2.3 Buckling Due to F(x); 2.3.1 General Equations; 2.3.2 Slope; 2.3.3 Angular Spring Constant 327 $a4.1 Introduction4.2 Bending Due to F(z): Triangular Shape; 4.2.1 General Equations; 4.2.2 Slope; 4.2.3 Angular Spring Constant; 4.2.4 Displacement; 4.2.5 Linear Spring Constant; 4.2.6 Numerical Examples; 4.3 Buckling due to F(x): Triangular Shape; 4.3.1 General Equations; 4.3.2 Slope; 4.3.3 Angular Spring Constant; 4.3.4 Displacement; 4.3.5 Linear Spring Constant; 4.3.6 Numerical Examples; 4.4 Bending due to F(z): V Shape; 4.4.1 General Equations; 4.4.2 Slope; 4.4.3 Angular Spring Constant; 4.4.4 Displacement; 4.4.5 Linear Spring Constant; 4.4.6 Numerical Examples 327 $a6.2 Tip-Sample Interaction 330 $aThis new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, 606 $aScanning probe microscopy$xData processing 615 0$aScanning probe microscopy$xData processing. 676 $a502.82 700 $aSarid$b Dror$0745994 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910829932503321 996 $aExploring scanning probe microscopy with mathematica$93976349 997 $aUNINA