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1. |
Record Nr. |
UNINA9910455186203321 |
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Autore |
Holmes Larry E (Larry Eugene), <1942-> |
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Titolo |
Grand theater [[electronic resource] ] : regional governance in Stalin's Russia, 1931-1941 / / Larry E. Holmes |
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Pubbl/distr/stampa |
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Lanham, MD, : Lexington Books, c2009 |
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ISBN |
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1-282-49452-X |
9786612494529 |
0-7391-3593-7 |
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Descrizione fisica |
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1 online resource (282 p.) |
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Disciplina |
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Soggetti |
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Bureaucracy - Soviet Union - History |
Regionalism - Soviet Union - History |
Electronic books. |
Soviet Union Politics and government |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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A script of perfection, failure, blame -- Ascent into darkness : escalating negativity, 1931-1941 -- A symbiosis of errors : the personal, professional, and political, 1931-1938 -- The art of complaint, 1931-1938 -- Power to the people and to the state : great performances by V.P. Bulygina and E.T. Chernykh -- "My friend, I've hit rock bottom" : politics and friendship -- A tragedy : the terror -- Degeneration of the symbiosis of errors, 1938-1941 -- "Stop this petty tyranny" : letters and the administration of schools in Falenki, 1940-1941 -- Proprietary professionalism : mine by right, 1938-1941. |
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Sommario/riassunto |
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Grand Theater examines bureaucracy not as a readily identifiable structure, which it certainly was, but rather as a process of day-to-day operation. Thus it is concerned with how agencies of both the Communist Party and the state apparatus not only implemented directives from above but also responded to perceived successes and failures, chose to produce, share, and conceal information, and reacted when common citizens injected themselves into governance by making demands and complaints. |
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2. |
Record Nr. |
UNINA9910829932503321 |
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Autore |
Sarid Dror |
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Titolo |
Exploring scanning probe microscopy with mathematica / / Dror Sarid |
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Pubbl/distr/stampa |
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Weinheim, [Germany] : , : Wiley-VCH Verlag GmbH & Co. KGaA, , 2007 |
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©2007 |
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ISBN |
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1-280-85452-9 |
9786610854523 |
3-527-61006-5 |
3-527-60987-3 |
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Edizione |
[2nd ed.] |
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Descrizione fisica |
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1 online resource (312 p.) |
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Disciplina |
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Soggetti |
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Scanning probe microscopy - Data processing |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references at the end of each chapters and index. |
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Nota di contenuto |
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Exploring Scanning Probe Microscopy with MATHEMATICA; Contents; Preface; 1 Introduction; 1.1 Style; 1.2 Mathematica Preparation; 1.2.1 General; 1.2.2 Example; 1.3 Recommended Books; 1.3.1 Mathematica Programming Language; 1.3.2 Scanning Probe Microscopies; 2 Uniform Cantilevers; 2.1 Introduction; 2.2 Bending Due to F(z); 2.2.1 General Equations; 2.2.2 Slope; 2.2.3 Angular Spring Constant; 2.2.4 Displacement; 2.2.5 Linear Spring Constant; 2.2.6 Numerical Example: Si; 2.2.7 Numerical Example: PtIr; 2.3 Buckling Due to F(x); 2.3.1 General Equations; 2.3.2 Slope; 2.3.3 Angular Spring Constant |
4.1 Introduction4.2 Bending Due to F(z): Triangular Shape; 4.2.1 General Equations; 4.2.2 Slope; 4.2.3 Angular Spring Constant; 4.2.4 Displacement; 4.2.5 Linear Spring Constant; 4.2.6 Numerical Examples; 4.3 Buckling due to F(x): Triangular Shape; 4.3.1 General Equations; 4.3.2 Slope; 4.3.3 Angular Spring Constant; 4.3.4 Displacement; 4.3.5 Linear Spring Constant; 4.3.6 Numerical Examples; 4.4 Bending due to F(z): V Shape; 4.4.1 General Equations; 4.4.2 Slope; 4.4.3 Angular Spring Constant; 4.4.4 Displacement; 4.4.5 Linear Spring Constant; 4.4.6 Numerical Examples |
6.2 Tip-Sample Interaction |
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Sommario/riassunto |
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This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, |
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