{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":1,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":23,"n_cols":5,"rows_kept":23,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[2,4,2,5],[3,2,3,3],[5,2,5,3],[9,2,9,3],[10,2,10,3],[11,2,11,3],[12,2,12,3],[13,2,13,3],[14,2,14,3],[18,2,18,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNINA9910829932503321"]
[null,null,"Autore",null,"Sarid Dror"]
[null,null,"Titolo",null,"Exploring scanning probe microscopy with mathematica / / Dror Sarid"]
[null,null,"Pubbl/distr/stampa",null,"Weinheim, [Germany] : , : Wiley-VCH Verlag GmbH & Co. KGaA, , 2007"]
[{"$nulls":4},"©2007"]
[null,null,"ISBN",null,"1-280-85452-9"]
[{"$nulls":4},"9786610854523"]
[{"$nulls":4},"3-527-61006-5"]
[{"$nulls":4},"3-527-60987-3"]
[null,null,"Edizione",null,"[2nd ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (312 p.)"]
[null,null,"Disciplina",null,"502.82"]
[null,null,"Soggetti",null,"Scanning probe microscopy - Data processing"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references at the end of each chapters and index."]
[null,null,"Nota di contenuto",null,"Exploring Scanning Probe Microscopy with MATHEMATICA; Contents; Preface; 1 Introduction; 1.1 Style; 1.2 Mathematica Preparation; 1.2.1 General; 1.2.2 Example; 1.3 Recommended Books; 1.3.1 Mathematica Programming Language; 1.3.2 Scanning Probe Microscopies; 2 Uniform Cantilevers; 2.1 Introduction; 2.2 Bending Due to F(z); 2.2.1 General Equations; 2.2.2 Slope; 2.2.3 Angular Spring Constant; 2.2.4 Displacement; 2.2.5 Linear Spring Constant; 2.2.6 Numerical Example: Si; 2.2.7 Numerical Example: PtIr; 2.3 Buckling Due to F(x); 2.3.1 General Equations; 2.3.2 Slope; 2.3.3 Angular Spring Constant"]
[{"$nulls":4},"4.1 Introduction4.2 Bending Due to F(z): Triangular Shape; 4.2.1 General Equations; 4.2.2 Slope; 4.2.3 Angular Spring Constant; 4.2.4 Displacement; 4.2.5 Linear Spring Constant; 4.2.6 Numerical Examples; 4.3 Buckling due to F(x): Triangular Shape; 4.3.1 General Equations; 4.3.2 Slope; 4.3.3 Angular Spring Constant; 4.3.4 Displacement; 4.3.5 Linear Spring Constant; 4.3.6 Numerical Examples; 4.4 Bending due to F(z): V Shape; 4.4.1 General Equations; 4.4.2 Slope; 4.4.3 Angular Spring Constant; 4.4.4 Displacement; 4.4.5 Linear Spring Constant; 4.4.6 Numerical Examples"]
[{"$nulls":4},"6.2 Tip-Sample Interaction"]
[null,null,null,"Sommario/riassunto","This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides "]
[{"$nulls":4},"a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy,"]