2012 23rd Annual SEMI Advanced Semiconductor Manufacturing Conference
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| Titolo: |
2012 23rd Annual SEMI Advanced Semiconductor Manufacturing Conference
|
| Pubblicazione: | [Place of publication not identified], : IEEE, 2012 |
| Descrizione fisica: | 1 online resource |
| Disciplina: | 658.562 |
| Soggetto topico: | Process control |
| Semiconductor industry - Management | |
| Persona (resp. second.): | IEEE Staff |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Nota di contenuto: | ASMC 2012 proceedings produced by: semi [advertisement] -- Organizing Committee -- Corporate sponsors -- Table of contents -- Identifying systematic critical features using silicon diagnosis data -- Using selective voltage binning to maximize yield -- Analytic modeling of AC response to FET-level elements for CLY optimization -- Optimizing product yield using manufacturing defect weights -- Improving yield learning by electrical fault inspection -- Innovative approach to identify location of AMC source in cleanroom by inverse Computational Fluid Dynamics modeling -- Managing variability within wafertest production by combining lean and six sigma. |
| Titolo autorizzato: | 2012 23rd Annual SEMI Advanced Semiconductor Manufacturing Conference |
| ISBN: | 9781467303514 |
| 1467303518 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910130718603321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |