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1. |
Record Nr. |
UNISOBSOB019377 |
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Autore |
Di_Maria, Franco |
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Titolo |
Gruppi : metodi e strumenti / cur. Franco Di Maria ; Girolamo Lo Verso |
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ISBN |
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Descrizione fisica |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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2. |
Record Nr. |
UNINA9910130718603321 |
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Titolo |
2012 23rd Annual SEMI Advanced Semiconductor Manufacturing Conference |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE, 2012 |
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ISBN |
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Descrizione fisica |
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Disciplina |
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Soggetti |
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Process control |
Semiconductor industry - Management |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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Nota di contenuto |
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ASMC 2012 proceedings produced by: semi [advertisement] -- Organizing Committee -- Corporate sponsors -- Table of contents -- Identifying systematic critical features using silicon diagnosis data -- Using selective voltage binning to maximize yield -- Analytic modeling of AC response to FET-level elements for CLY optimization -- Optimizing product yield using manufacturing defect weights -- |
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Improving yield learning by electrical fault inspection -- Innovative approach to identify location of AMC source in cleanroom by inverse Computational Fluid Dynamics modeling -- Managing variability within wafertest production by combining lean and six sigma. |
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