Measurement techniques for high-power semiconductor materials and devices : annual report, January 1, 1982 to March 31, 1983 / / W. R. Thurber; J. R. Lowney; W. E. Phillips
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| Autore: |
Thurber W. Robert
|
| Titolo: |
Measurement techniques for high-power semiconductor materials and devices : annual report, January 1, 1982 to March 31, 1983 / / W. R. Thurber; J. R. Lowney; W. E. Phillips
|
| Pubblicazione: | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1984 |
| Descrizione fisica: | 1 online resource |
| Altri autori: |
LowneyJ. R
PhillipsW. E
ThurberW. Robert
|
| Note generali: | 1984. |
| Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes. | |
| Title from PDF title page. | |
| Nota di bibliografia: | Includes bibliographical references. |
| Altri titoli varianti: | Measurement techniques for high-power semiconductor materials and devices |
| Titolo autorizzato: | Measurement techniques for high-power semiconductor materials and devices |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910710590703321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |