LEADER 00945nam0-22003131i-450- 001 990007240170403321 005 20100315131351.0 035 $a000724017 035 $aFED01000724017 035 $a(Aleph)000724017FED01 035 $a000724017 100 $a20021021d--------km-y0itay50------ba 101 0 $aita 200 1 $a<>FATTORE occupazionale nelle crisi di impresa$ecommentario alla l. 23 luglio 1991 n. 223$f( a cura di ) MaurizioCinelli. 210 $aTorino$cGiappichelli$d1993. 215 $aXI, 413 p.$d24 cm 676 $a346.07 676 $a344 702 1$aCinelli,$bMaurizio 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990007240170403321 952 $aA-IX-195$b22 sc. civ.$fDDRC 952 $aG-66;A-IX-195$b22 sc. c.,7848 dip$fDDRC 952 $aDPR 29-481$b12642$fDEC 959 $aDDRC 959 $aDEC 996 $aFATTORE occupazionale nelle crisi di impresa$9687953 997 $aUNINA LEADER 01562aam 2200409I 450 001 9910710590703321 005 20231117235049.0 024 8 $aGOVPUB-C13-816035d34a70cf1c8553e463d2b4cfee 035 $a(CKB)5470000002477386 035 $a(OCoLC)947843700 035 $a(EXLCZ)995470000002477386 100 $a20160426d1984 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aMeasurement techniques for high-power semiconductor materials and devices $eannual report, January 1, 1982 to March 31, 1983 /$fW. R. Thurber; J. R. Lowney; W. E. Phillips 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1984. 215 $a1 online resource 225 1 $aNBSIR ;$v84-2838 300 $a1984. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 517 $aMeasurement techniques for high-power semiconductor materials and devices 700 $aThurber$b W. Robert$01390342 701 $aLowney$b J. R$01390343 701 $aPhillips$b W. E$01390344 701 $aThurber$b W. Robert$01390342 712 02$aUnited States.$bNational Bureau of Standards. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910710590703321 996 $aMeasurement techniques for high-power semiconductor materials and devices$93442947 997 $aUNINA