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A FORTRAN program for calculating the electrical parameters of extrinsic silicon
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Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satelites
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Measurement techniques for high power semiconductor materials and devices
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Measurement techniques for high power semiconductor materials and devices
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Measurement techniques for high-power semiconductor materials and devices
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Resistivity and carrier lifetime in gold-doped silicon
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Theory and application of a two-layer hall technique
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