An approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials / / David L. Duewer, Reenie M. Parris, Edward V. White, Willie E. May, Howard Elbaum
(Visualizza in formato marc)
(Visualizza in BIBFRAME)
| Autore: |
Duewer David L
|
| Titolo: |
An approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials / / David L. Duewer, Reenie M. Parris, Edward V. White, Willie E. May, Howard Elbaum
|
| Pubblicazione: | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 |
| Descrizione fisica: | 1 online resource |
| Altri autori: |
DuewerDavid L
ElbaumHoward
MayWillie E
ParrisReenie M
WhiteEdward V
|
| Note generali: | 2004. |
| Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes. | |
| Title from PDF title page. | |
| Nota di bibliografia: | Includes bibliographical references. |
| Titolo autorizzato: | An approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910709541003321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |