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Record Nr. |
UNINA9910709541003321 |
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Autore |
Duewer David L |
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Titolo |
An approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials / / David L. Duewer, Reenie M. Parris, Edward V. White, Willie E. May, Howard Elbaum |
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Pubbl/distr/stampa |
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2004 |
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Descrizione fisica |
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Collana |
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NIST special publication ; ; 1012 |
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Altri autori (Persone) |
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DuewerDavid L |
ElbaumHoward |
MayWillie E |
ParrisReenie M |
WhiteEdward V |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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2004. |
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes. |
Title from PDF title page. |
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Nota di bibliografia |
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Includes bibliographical references. |
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