01644aam 2200421I 450 991070954100332120151026040617.0GOVPUB-C13-4deb8161f847bd340393baf9afc71507(CKB)5470000002479592(OCoLC)926750888(EXLCZ)99547000000247959220151026d2004 ua 0engrdacontentrdamediardacarrierAn approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials /David L. Duewer, Reenie M. Parris, Edward V. White, Willie E. May, Howard ElbaumGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2004.1 online resourceNIST special publication ;10122004.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Duewer David L1388859Duewer David L1388859Elbaum Howard1421492May Willie E1392232Parris Reenie M1390710White Edward V1410402National Institute of Standards and Technology (U.S.)NBSNBSGPOBOOK9910709541003321An approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials3542911UNINA