LEADER 01644aam  2200421I  450 
001 9910709541003321
005 20151026040617.0
024 8 $aGOVPUB-C13-4deb8161f847bd340393baf9afc71507
035   $a(CKB)5470000002479592
035   $a(OCoLC)926750888
035   $a(EXLCZ)995470000002479592
100   $a20151026d2004      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 13$aAn approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials /$fDavid L. Duewer, Reenie M. Parris, Edward V. White, Willie E. May, Howard Elbaum
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2004.
215   $a1 online resource
225 1 $aNIST special publication ;$v1012
300   $a2004.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aDuewer$b David L$01388859
701   $aDuewer$b David L$01388859
701   $aElbaum$b Howard$01421492
701   $aMay$b Willie E$01392232
701   $aParris$b Reenie M$01390710
701   $aWhite$b Edward V$01410402
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709541003321
996   $aAn approach to the metrologically sound traceable assessment of the chemical purity of organic reference materials$93542911
997   $aUNINA