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Autore: |
Wang Ran
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Titolo: |
Testing of Interposer-Based 2.5D Integrated Circuits / / by Ran Wang, Krishnendu Chakrabarty
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Pubblicazione: | Cham : , : Springer International Publishing : , : Imprint : Springer, , 2017 |
Edizione: | 1st ed. 2017. |
Descrizione fisica: | 1 online resource (XIV, 182 p. 118 illus., 102 illus. in color.) |
Disciplina: | 621.3815 |
Soggetto topico: | Electronic circuits |
Microprocessors | |
Logic design | |
Circuits and Systems | |
Processor Architectures | |
Logic Design | |
Persona (resp. second.): | ChakrabartyKrishnendu |
Nota di bibliografia: | Includes bibliographical references at the end of each chapters. |
Nota di contenuto: | Introduction -- Pre-Bond Testing of the Silicon Interposer -- Post-Bond Scan-based Testing of Interposer Interconnects -- Test Architecture and Test-Path Scheduling -- Built-In Self-Test -- ExTest Scheduling and Optimization -- A Programmable Method for Low-Power Scan Shift in SoC Dies -- Conclusions.-. |
Sommario/riassunto: | This book provides readers with an insightful guide to the design, testing and optimization of 2.5D integrated circuits. The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies. This book covers many testing techniques that have already been used in mainstream semiconductor companies. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 2.5D ICs a reality and commercially viable. Provides a single-source guide to the practical challenges in testing of 2.5D ICs; Presents an efficient method to locate defects in a passive interposer before stacking; Describes an efficient interconnect-test solution to target through-silicon vias (TSVs), the redistribution layer, and micro-bumps for shorts, opens, and delay faults; Provides a built-in self-test (BIST) architecture that can be enabled by the standard TAP controller in the IEEE 1149.1 standard; Discusses two ExTest scheduling strategies to implement interconnect testing between tiles inside an SoC die; Includes a programmable method for shift-clock stagger assignment to reduce power supply noise during SoC die testing in 2.5D ICs. |
Titolo autorizzato: | Testing of Interposer-Based 2.5D Integrated Circuits ![]() |
ISBN: | 3-319-54714-3 |
Formato: | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910254335203321 |
Lo trovi qui: | Univ. Federico II |
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