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Strain-Engineered MOSFETs / C. K. Maiti, T. K. Maiti



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Autore: Maiti C. K Visualizza persona
Titolo: Strain-Engineered MOSFETs / C. K. Maiti, T. K. Maiti Visualizza cluster
Pubblicazione: Boca Raton : , : CRC Press, , 2012
Descrizione fisica: 1 online resource (1 p.)
Soggetto topico: Technology & Engineering / Electronics / Microelectronics
Technology
Persona (resp. second.): MaitiT. K
Sommario/riassunto: This book brings together new developments in the area of strain-engineered MOSFETs using high-mibility substrates such as SIGe, strained-Si, germanium-on-insulator and III-V semiconductors into a single text which will cover the materials aspects, principles, and design of advanced devices, their fabrication and applications. The book presents a full TCAD methodology for strain-engineering in Si CMOS technology involving data flow from process simulation to systematic process variability simulation and generation of SPICE process compact models for manufacturing for yield optimization.
Titolo autorizzato: Strain-Engineered MOSFETs  Visualizza cluster
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910870868603321
Lo trovi qui: Univ. Federico II
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