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1. |
Record Nr. |
UNINA9910813209103321 |
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Autore |
Hendrikse Jeanet |
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Titolo |
Identifying ignitable liquids in fire debris : a guideline for forensic experts / / Jeanet Hendrikse, Michiel Grutters, Frank Schäfer |
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Pubbl/distr/stampa |
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Amsterdam, [Netherlands] : , : Academic Press, , 2016 |
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©2016 |
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ISBN |
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Descrizione fisica |
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1 online resource : illustrations |
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Disciplina |
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Soggetti |
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Flammable liquids |
Fire investigation |
Forensic sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references. |
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Sommario/riassunto |
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Identifying Ignitable Liquids in Fire Debris: A Guideline for Forensic Experts discusses and illustrates the characteristics of different ignitable liquid products. This guideline builds on the minimum criteria of the ignitable liquid classes defined in the internationally accepted standard ASTM E1618 Standard Test Method for Ignitable Liquid Residues in Extracts from Fire Debris Samples by Gas Chromatography-Mass Spectrometry. The volume provides information on the origin of the characteristics of these ignitable liquid products and provides a summary of characteristics to demonstrate a positive identification of the particular product class. Topics such as the term ignitable liquid, relevant guidelines for fire debris analysis, production processes of ignitable liquids, fire debris analysis methods, and interferences in fire debris analysis, are briefly discussed as these topics are essential for the understanding of the identification and classification of ignitable liquid residues in fire debris.--publisher. |
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2. |
Record Nr. |
UNINA9910870868603321 |
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Autore |
Maiti C. K |
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Titolo |
Strain-Engineered MOSFETs / C. K. Maiti, T. K. Maiti |
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Pubbl/distr/stampa |
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Boca Raton : , : CRC Press, , 2012 |
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Descrizione fisica |
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Soggetti |
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Technology & Engineering / Electronics / Microelectronics |
Technology |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Sommario/riassunto |
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This book brings together new developments in the area of strain-engineered MOSFETs using high-mibility substrates such as SIGe, strained-Si, germanium-on-insulator and III-V semiconductors into a single text which will cover the materials aspects, principles, and design of advanced devices, their fabrication and applications. The book presents a full TCAD methodology for strain-engineering in Si CMOS technology involving data flow from process simulation to systematic process variability simulation and generation of SPICE process compact models for manufacturing for yield optimization. |
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