Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1980 to December 31, 1981 / / W. R. Thurber; W. E. Phillips; R. D. Larrabee

• Autore: Thurber W. Robert
• Pubblicazione: Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1982
• Descrizione fisica: 1 online resource
• Altri autori: LarrabeeR. D PhillipsW. E ThurberW. Robert
• Note generali: 1982.; Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.; Title from PDF title page.
• Nota di bibliografia: Includes bibliographical references.
• Altri titoli varianti: Measurement techniques for high power semiconductor materials and devices
• Titolo autorizzato: Measurement techniques for high power semiconductor materials and devices
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910710255303321
• Lo trovi qui: Univ. Federico II