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| Autore: |
Maiti C. K
|
| Titolo: |
Strain-Engineered MOSFETs / C. K. Maiti, T. K. Maiti
|
| Pubblicazione: | Boca Raton : , : CRC Press, , 2012 |
| Descrizione fisica: | 1 online resource (1 p.) |
| Soggetto topico: | Technology & Engineering / Electronics / Microelectronics |
| Technology | |
| Persona (resp. second.): | MaitiT. K |
| Sommario/riassunto: | This book brings together new developments in the area of strain-engineered MOSFETs using high-mibility substrates such as SIGe, strained-Si, germanium-on-insulator and III-V semiconductors into a single text which will cover the materials aspects, principles, and design of advanced devices, their fabrication and applications. The book presents a full TCAD methodology for strain-engineering in Si CMOS technology involving data flow from process simulation to systematic process variability simulation and generation of SPICE process compact models for manufacturing for yield optimization. |
| Titolo autorizzato: | Strain-Engineered MOSFETs ![]() |
| Formato: | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910870868603321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |