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Electromigration modeling at circuit layout level / / Cher Ming Tan, Feifei He
| Electromigration modeling at circuit layout level / / Cher Ming Tan, Feifei He |
| Autore | Tan Cher Ming |
| Edizione | [1st ed. 2013.] |
| Pubbl/distr/stampa | Singapore : , : Springer, , 2013 |
| Descrizione fisica | 1 online resource (x, 103 pages) : illustrations (chiefly color) |
| Disciplina | 621.3815 |
| Collana | SpringerBriefs in Reliability |
| Soggetto topico |
Integrated circuits - Reliability
Electrodiffusion |
| ISBN | 981-4451-21-5 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Introduction -- 3D Circuit Model Construction and Simulation -- Comparison of EM Performance in Circuit Structure and Test Structure -- Interconnect EM Reliability Modeling at Circuit Layout Level -- Conclusion. |
| Record Nr. | UNINA-9910739461403321 |
Tan Cher Ming
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| Singapore : , : Springer, , 2013 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Reliability Analysis of Electrotechnical Devices
| Reliability Analysis of Electrotechnical Devices |
| Autore | Tan Cher Ming |
| Pubbl/distr/stampa | Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 |
| Descrizione fisica | 1 electronic resource (174 p.) |
| Soggetto topico |
Technology: general issues
History of engineering & technology |
| Soggetto non controllato |
3D-IC (three-dimensional integrated circuit)
electromagnetic interference near field measurement SAC305 BGA low temperature fracture failure factorial design of experiment genetic algorithm optimization return loss multiple-input multiple-output (MIMO) single event effects linear energy transfer Monte Carlo simulation radiation hardness pressureless sintered micron silver joints deep space environment extreme thermal shocks reconstruction simulation elastic mechanical properties state of health remaining useful life electrochemistry based electrical model semi-empirical capacity fading model useful life distribution quality and reliability assurance single event effect microdosimetry lineal energy deconvolution gamma process lifetime measurement system analysis reliability estimation GaN operational amplifier proton therapy prompt gamma imaging 3D X-ray bias temperature-humidity reliability test conductive anodic filament (CAF) de-penalization finite element analysis |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910585945603321 |
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Tan Cher Ming
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| Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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