03141nam 2200901z- 450 991058594560332120220812(CKB)5600000000483020(oapen)https://directory.doabooks.org/handle/20.500.12854/91210(oapen)doab91210(EXLCZ)99560000000048302020202208d2022 |y 0engurmn|---annantxtrdacontentcrdamediacrrdacarrierReliability Analysis of Electrotechnical DevicesBaselMDPI - Multidisciplinary Digital Publishing Institute20221 online resource (174 p.)3-0365-4653-7 3-0365-4654-5 This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.History of engineering & technologybicsscTechnology: general issuesbicssc3D X-ray3D-IC (three-dimensional integrated circuit)BGAbias temperature-humidity reliability testconductive anodic filament (CAF)de-penalizationdeconvolutiondeep space environmentelastic mechanical propertieselectrochemistry based electrical modelelectromagnetic interferenceextreme thermal shocksfactorial design of experimentfinite element analysisfracture failuregamma processGaNgenetic algorithm optimizationlifetimelineal energylinear energy transferlow temperaturemeasurement system analysismicrodosimetryMonte Carlo simulationmultiple-input multiple-output (MIMO)n/anear field measurementoperational amplifierpressureless sintered micron silver jointsprompt gamma imagingproton therapyquality and reliability assuranceradiation hardnessreconstructionreliability estimationremaining useful lifereturn lossSAC305semi-empirical capacity fading modelsimulationsingle event effectsingle event effectsstate of healthuseful life distributionHistory of engineering & technologyTechnology: general issuesTan Cher Mingedt1064328Tan Cher MingothBOOK9910585945603321Reliability Analysis of Electrotechnical Devices3040825UNINA