03104nam 2200877z- 450 991058594560332120231214132938.0(CKB)5600000000483020(oapen)https://directory.doabooks.org/handle/20.500.12854/91210(EXLCZ)99560000000048302020202208d2022 |y 0engurmn|---annantxtrdacontentcrdamediacrrdacarrierReliability Analysis of Electrotechnical DevicesBaselMDPI - Multidisciplinary Digital Publishing Institute20221 electronic resource (174 p.)3-0365-4653-7 3-0365-4654-5 This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.Technology: general issuesbicsscHistory of engineering & technologybicssc3D-IC (three-dimensional integrated circuit)electromagnetic interferencenear field measurementSAC305BGAlow temperaturefracture failurefactorial design of experimentgenetic algorithm optimizationreturn lossmultiple-input multiple-output (MIMO)single event effectslinear energy transferMonte Carlo simulationradiation hardnesspressureless sintered micron silver jointsdeep space environmentextreme thermal shocksreconstructionsimulationelastic mechanical propertiesstate of healthremaining useful lifeelectrochemistry based electrical modelsemi-empirical capacity fading modeluseful life distributionquality and reliability assurancesingle event effectmicrodosimetrylineal energydeconvolutiongamma processlifetimemeasurement system analysisreliability estimationGaNoperational amplifierproton therapyprompt gamma imaging3D X-raybias temperature-humidity reliability testconductive anodic filament (CAF)de-penalizationfinite element analysisTechnology: general issuesHistory of engineering & technologyTan Cher Mingedt1064328Tan Cher MingothBOOK9910585945603321Reliability Analysis of Electrotechnical Devices3040825UNINA