LEADER 03840nam 22006734a 450 001 9910965255003321 005 20200520144314.0 010 $a9786612162084 010 $a9781282162082 010 $a128216208X 010 $a9789027297655 010 $a9027297657 035 $a(CKB)1000000000555924 035 $a(OCoLC)666940094 035 $a(CaPaEBR)ebrary10022323 035 $a(SSID)ssj0000280968 035 $a(PQKBManifestationID)11226911 035 $a(PQKBTitleCode)TC0000280968 035 $a(PQKBWorkID)10300197 035 $a(PQKB)11654670 035 $a(MiAaPQ)EBC622721 035 $a(DE-B1597)720206 035 $a(DE-B1597)9789027297655 035 $a(EXLCZ)991000000000555924 100 $a20010727d2002 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aInvisible work $ebilingualism, language choice, and childrearing in intermarried families /$fToshie Okita 205 $a1st ed. 210 $aAmsterdam ;$aPhiladelphia $cBenjamins Pub. Co.$dc2002 215 $a1 online resource (285 p.) 225 1 $aImpact, studies in language and society,$x1385-7908 ;$v12 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9781588111067 311 08$a1588111067 311 08$a9789027218476 311 08$a9027218471 320 $aIncludes bibliographical references (p. [235]-250) and index. 327 $aInvisibleWork -- Editorial page -- Title page -- LCC data -- Table of contents -- List of figures and tables -- Acknowledgements -- Chapter 1: Introduction -- Chapter 2: Developing a conceptual framework -- Chapter 3: Research methods -- Chapter 4: Japanese-British families in the UK -- Chapter 5: Initial language decision -- Chapter 6: Getting on -- Chapter 7: Childrearing -- Chapter 8: Going to school -- Chapter 9: Family relationships, identity and ethnicity -- Chapter 10: Concluding discussion -- Bibliography -- Appendix 1 -- Appendix 2 -- Appendix 3 -- Index -- IMPACT: Studies in Language and Society. 330 $aThere is growing recognition that 'context' is important for bilingual language development, but understanding of that context remains underdeveloped. This innovative study, spanning the fields of bilingualism, ethnicity and family studies, shows how language use in intermarried families is deeply intertwined with the experience of everyday childrearing, in specific socio-historical contexts. This is why, despite good intentions, expert advice and effort, bilingual-child rearing often encounters difficulties. Conversely, drawing on in-depth interviews of twenty eight Japanese mother - British father families in the UK, the study uses a focus on language issues to portray actual childrearing dynamics and 'situated ethnicity' in intermarried families. Presenting a vivid picture of the 'invisible work' of mothers in these families, and how they attempt to resolve conflicting pressures and demands over childrearing, language and education, the author shows the importance of 'recognition' and shared responsibility. This book will interest researchers, practitioners and parents interested in bilingualism, ethnically diverse families and multicultural education. 410 0$aImpact, studies in language and society ;$v12. 606 $aBilingualism$zGreat Britain 606 $aJapanese$zGreat Britain$xLanguages 606 $aChild rearing$zGreat Britain 615 0$aBilingualism 615 0$aJapanese$xLanguages. 615 0$aChild rearing 676 $a420/.42956/0941 700 $aOkita$b Toshie$01800893 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910965255003321 996 $aInvisible work$94345853 997 $aUNINA LEADER 03141nam 2200901z- 450 001 9910585945603321 005 20220812 035 $a(CKB)5600000000483020 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/91210 035 $a(oapen)doab91210 035 $a(EXLCZ)995600000000483020 100 $a20202208d2022 |y 0 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aReliability Analysis of Electrotechnical Devices 210 $aBasel$cMDPI - Multidisciplinary Digital Publishing Institute$d2022 215 $a1 online resource (174 p.) 311 08$a3-0365-4653-7 311 08$a3-0365-4654-5 330 $aThis is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards. 606 $aHistory of engineering & technology$2bicssc 606 $aTechnology: general issues$2bicssc 610 $a3D X-ray 610 $a3D-IC (three-dimensional integrated circuit) 610 $aBGA 610 $abias temperature-humidity reliability test 610 $aconductive anodic filament (CAF) 610 $ade-penalization 610 $adeconvolution 610 $adeep space environment 610 $aelastic mechanical properties 610 $aelectrochemistry based electrical model 610 $aelectromagnetic interference 610 $aextreme thermal shocks 610 $afactorial design of experiment 610 $afinite element analysis 610 $afracture failure 610 $agamma process 610 $aGaN 610 $agenetic algorithm optimization 610 $alifetime 610 $alineal energy 610 $alinear energy transfer 610 $alow temperature 610 $ameasurement system analysis 610 $amicrodosimetry 610 $aMonte Carlo simulation 610 $amultiple-input multiple-output (MIMO) 610 $an/a 610 $anear field measurement 610 $aoperational amplifier 610 $apressureless sintered micron silver joints 610 $aprompt gamma imaging 610 $aproton therapy 610 $aquality and reliability assurance 610 $aradiation hardness 610 $areconstruction 610 $areliability estimation 610 $aremaining useful life 610 $areturn loss 610 $aSAC305 610 $asemi-empirical capacity fading model 610 $asimulation 610 $asingle event effect 610 $asingle event effects 610 $astate of health 610 $auseful life distribution 615 7$aHistory of engineering & technology 615 7$aTechnology: general issues 700 $aTan$b Cher Ming$4edt$01064328 702 $aTan$b Cher Ming$4oth 906 $aBOOK 912 $a9910585945603321 996 $aReliability Analysis of Electrotechnical Devices$93040825 997 $aUNINA