LEADER 03141nam  2200901z- 450 
001 9910585945603321
005 20220812
035   $a(CKB)5600000000483020
035   $a(oapen)https://directory.doabooks.org/handle/20.500.12854/91210
035   $a(oapen)doab91210
035   $a(EXLCZ)995600000000483020
100   $a20202208d2022      |y         0
101 0 $aeng
135   $aurmn|---annan
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aReliability Analysis of Electrotechnical Devices
210   $aBasel$cMDPI - Multidisciplinary Digital Publishing Institute$d2022
215   $a1 online resource (174 p.)
311 08$a3-0365-4653-7 
311 08$a3-0365-4654-5 
330   $aThis is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.
606   $aHistory of engineering & technology$2bicssc
606   $aTechnology: general issues$2bicssc
610   $a3D X-ray
610   $a3D-IC (three-dimensional integrated circuit)
610   $aBGA
610   $abias temperature-humidity reliability test
610   $aconductive anodic filament (CAF)
610   $ade-penalization
610   $adeconvolution
610   $adeep space environment
610   $aelastic mechanical properties
610   $aelectrochemistry based electrical model
610   $aelectromagnetic interference
610   $aextreme thermal shocks
610   $afactorial design of experiment
610   $afinite element analysis
610   $afracture failure
610   $agamma process
610   $aGaN
610   $agenetic algorithm optimization
610   $alifetime
610   $alineal energy
610   $alinear energy transfer
610   $alow temperature
610   $ameasurement system analysis
610   $amicrodosimetry
610   $aMonte Carlo simulation
610   $amultiple-input multiple-output (MIMO)
610   $an/a
610   $anear field measurement
610   $aoperational amplifier
610   $apressureless sintered micron silver joints
610   $aprompt gamma imaging
610   $aproton therapy
610   $aquality and reliability assurance
610   $aradiation hardness
610   $areconstruction
610   $areliability estimation
610   $aremaining useful life
610   $areturn loss
610   $aSAC305
610   $asemi-empirical capacity fading model
610   $asimulation
610   $asingle event effect
610   $asingle event effects
610   $astate of health
610   $auseful life distribution
615  7$aHistory of engineering & technology
615  7$aTechnology: general issues
700   $aTan$b Cher Ming$4edt$01064328
702   $aTan$b Cher Ming$4oth
906   $aBOOK
912   $a9910585945603321
996   $aReliability Analysis of Electrotechnical Devices$93040825
997   $aUNINA