LEADER 03104nam 2200877z- 450 001 9910585945603321 005 20231214132938.0 035 $a(CKB)5600000000483020 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/91210 035 $a(EXLCZ)995600000000483020 100 $a20202208d2022 |y 0 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aReliability Analysis of Electrotechnical Devices 210 $aBasel$cMDPI - Multidisciplinary Digital Publishing Institute$d2022 215 $a1 electronic resource (174 p.) 311 $a3-0365-4653-7 311 $a3-0365-4654-5 330 $aThis is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards. 606 $aTechnology: general issues$2bicssc 606 $aHistory of engineering & technology$2bicssc 610 $a3D-IC (three-dimensional integrated circuit) 610 $aelectromagnetic interference 610 $anear field measurement 610 $aSAC305 610 $aBGA 610 $alow temperature 610 $afracture failure 610 $afactorial design of experiment 610 $agenetic algorithm optimization 610 $areturn loss 610 $amultiple-input multiple-output (MIMO) 610 $asingle event effects 610 $alinear energy transfer 610 $aMonte Carlo simulation 610 $aradiation hardness 610 $apressureless sintered micron silver joints 610 $adeep space environment 610 $aextreme thermal shocks 610 $areconstruction 610 $asimulation 610 $aelastic mechanical properties 610 $astate of health 610 $aremaining useful life 610 $aelectrochemistry based electrical model 610 $asemi-empirical capacity fading model 610 $auseful life distribution 610 $aquality and reliability assurance 610 $asingle event effect 610 $amicrodosimetry 610 $alineal energy 610 $adeconvolution 610 $agamma process 610 $alifetime 610 $ameasurement system analysis 610 $areliability estimation 610 $aGaN 610 $aoperational amplifier 610 $aproton therapy 610 $aprompt gamma imaging 610 $a3D X-ray 610 $abias temperature-humidity reliability test 610 $aconductive anodic filament (CAF) 610 $ade-penalization 610 $afinite element analysis 615 7$aTechnology: general issues 615 7$aHistory of engineering & technology 700 $aTan$b Cher Ming$4edt$01064328 702 $aTan$b Cher Ming$4oth 906 $aBOOK 912 $a9910585945603321 996 $aReliability Analysis of Electrotechnical Devices$93040825 997 $aUNINA