LEADER 01792nam 2200469 a 450 001 9910699607903321 005 20110131154548.0 035 $a(CKB)5470000002404862 035 $a(OCoLC)699513466 035 $a(EXLCZ)995470000002404862 100 $a20110131d2010 ua 0 101 0 $aeng 135 $aurmn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aBehavioral issues associated with long-duration space expeditions$b[electronic resource] $ereview and analysis of astronaut journals : experiment 01-E104 (Journals) : final report /$fJack Stuster 210 1$aHouston, Tex. :$cNational Aeronautics and Space Administration, Johnson Space Center,$d[2010] 215 $a1 online resource (62 pages) $cillustrations 225 1 $aNASA/TM ;$v2010-216130 300 $aTitle from title screen (viewed on Jan. 31, 2011). 300 $a"July 2010." 320 $aIncludes bibliographical references (page 62). 517 $aBehavioral issues associated with long-duration space expeditions 606 $aHuman factors engineering$2nasat 606 $aInternational Space Station$2nasat 606 $aLong duration space flight$2nasat 606 $aHuman behavior$2nasat 606 $aAstronaut performance$2nasat 615 7$aHuman factors engineering. 615 7$aInternational Space Station. 615 7$aLong duration space flight. 615 7$aHuman behavior. 615 7$aAstronaut performance. 700 $aStuster$b Jack$f1947-$01384464 712 02$aLyndon B. Johnson Space Center. 801 0$bGPO 801 1$bGPO 906 $aBOOK 912 $a9910699607903321 996 $aBehavioral issues associated with long-duration space expeditions$93483455 997 $aUNINA LEADER 03141nam 2200901z- 450 001 9910585945603321 005 20220812 035 $a(CKB)5600000000483020 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/91210 035 $a(oapen)doab91210 035 $a(EXLCZ)995600000000483020 100 $a20202208d2022 |y 0 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aReliability Analysis of Electrotechnical Devices 210 $aBasel$cMDPI - Multidisciplinary Digital Publishing Institute$d2022 215 $a1 online resource (174 p.) 311 08$a3-0365-4653-7 311 08$a3-0365-4654-5 330 $aThis is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards. 606 $aHistory of engineering & technology$2bicssc 606 $aTechnology: general issues$2bicssc 610 $a3D X-ray 610 $a3D-IC (three-dimensional integrated circuit) 610 $aBGA 610 $abias temperature-humidity reliability test 610 $aconductive anodic filament (CAF) 610 $ade-penalization 610 $adeconvolution 610 $adeep space environment 610 $aelastic mechanical properties 610 $aelectrochemistry based electrical model 610 $aelectromagnetic interference 610 $aextreme thermal shocks 610 $afactorial design of experiment 610 $afinite element analysis 610 $afracture failure 610 $agamma process 610 $aGaN 610 $agenetic algorithm optimization 610 $alifetime 610 $alineal energy 610 $alinear energy transfer 610 $alow temperature 610 $ameasurement system analysis 610 $amicrodosimetry 610 $aMonte Carlo simulation 610 $amultiple-input multiple-output (MIMO) 610 $an/a 610 $anear field measurement 610 $aoperational amplifier 610 $apressureless sintered micron silver joints 610 $aprompt gamma imaging 610 $aproton therapy 610 $aquality and reliability assurance 610 $aradiation hardness 610 $areconstruction 610 $areliability estimation 610 $aremaining useful life 610 $areturn loss 610 $aSAC305 610 $asemi-empirical capacity fading model 610 $asimulation 610 $asingle event effect 610 $asingle event effects 610 $astate of health 610 $auseful life distribution 615 7$aHistory of engineering & technology 615 7$aTechnology: general issues 700 $aTan$b Cher Ming$4edt$01064328 702 $aTan$b Cher Ming$4oth 906 $aBOOK 912 $a9910585945603321 996 $aReliability Analysis of Electrotechnical Devices$93040825 997 $aUNINA