Reliability Analysis of Electrotechnical Devices

• Record Nr.: UNINA9910585945603321
• Autore: Tan Cher Ming
• Pubbl/distr/stampa: Basel, : MDPI - Multidisciplinary Digital Publishing Institute, 2022
• Descrizione fisica: 1 electronic resource (174 p.)
• Soggetti: Technology: general issues; History of engineering & technology
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Sommario/riassunto: This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.