Vai al contenuto principale della pagina

Electron Microscopy in Science and Engineering / / edited by Krishanu Biswas, Sri Sivakumar, Nilesh Gurao



(Visualizza in formato marc)    (Visualizza in BIBFRAME)

Autore: Biswas Krishanu Visualizza persona
Titolo: Electron Microscopy in Science and Engineering / / edited by Krishanu Biswas, Sri Sivakumar, Nilesh Gurao Visualizza cluster
Pubblicazione: Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2022
Edizione: 1st ed. 2022.
Descrizione fisica: 1 online resource (153 pages)
Disciplina: 502.825
Soggetto topico: Materials
Spectrum analysis
Building materials
Materials Engineering
Spectroscopy
Structural Materials
Persona (resp. second.): SivakumarSri
GuraoNilesh
Nota di contenuto: Small scale deformation experiments inside an SEM -- In-situ Micromechanical Testing in Scanning Electron Microscopy -- Exploring Carbon Surface using Electron Microscopy: Applications to Energy, Environment and Health -- Electron Backscatter Diffraction Technique: Fundamentals to Applications -- Application of Electron backscatter diffraction (EBSD) method in Earth Sciences -- Electron Probe Micro-Analyser: An Equipment for Accurate and Precise Micro-Composition Analysis.
Sommario/riassunto: This issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute.
Titolo autorizzato: Electron microscopy in science and engineering  Visualizza cluster
ISBN: 981-16-5101-9
981-16-5100-0
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910743354603321
Lo trovi qui: Univ. Federico II
Opac: Controlla la disponibilità qui
Serie: IITK Directions, . 2509-6605 ; ; 6