1.

Record Nr.

UNINA9910743354603321

Autore

Biswas Krishanu

Titolo

Electron Microscopy in Science and Engineering / / edited by Krishanu Biswas, Sri Sivakumar, Nilesh Gurao

Pubbl/distr/stampa

Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2022

ISBN

981-16-5101-9

981-16-5100-0

Edizione

[1st ed. 2022.]

Descrizione fisica

1 online resource (153 pages)

Collana

IITK Directions, , 2509-6605 ; ; 6

Disciplina

502.825

Soggetti

Materials

Spectrum analysis

Building materials

Materials Engineering

Spectroscopy

Structural Materials

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Nota di contenuto

Small scale deformation experiments inside an SEM -- In-situ Micromechanical Testing in Scanning Electron Microscopy -- Exploring Carbon Surface using Electron Microscopy: Applications to Energy, Environment and Health -- Electron Backscatter Diffraction Technique: Fundamentals to Applications -- Application of Electron backscatter diffraction (EBSD) method in Earth Sciences -- Electron Probe Micro-Analyser: An Equipment for Accurate and Precise Micro-Composition Analysis.

Sommario/riassunto

This issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers



across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute.