01102nam0 22002651i 450 UON0039747920231205104641.39420110923d2011 |0itac50 baitaSLVGERIT||||e |||||Nasa sprahaZiljsko iz UkevDizionario zegliano di UgovizzaAlessandro OmanPontebbaUdComunità Montana del Gemonese, Canal del Ferro e Val Canale2011205 p.ill.30 cm.LINGUA SLOVENADIALETTIUONC067824FIPontebba (Udine)UONL004892891.84Letteratura slovena21OMANAlessandroUONV204212706319Comunità Montana del Gemonese , Canal del Ferro, e Val CanaleUONV278569650ITSOL20240220RICASIBA - SISTEMA BIBLIOTECARIO DI ATENEOUONSIUON00397479SIBA - SISTEMA BIBLIOTECARIO DI ATENEOSI SLOVENO D 0074 SI EO 47295 5 0074 Nasa spraha1347703UNIOR03234nam 22006375 450 991074335460332120251113180956.0981-16-5101-9981-16-5100-0981-16-5101-910.1007/978-981-16-5101-4(MiAaPQ)EBC6885916(Au-PeEL)EBL6885916(CKB)21167810700041(PPN)260828904(OCoLC)1296677199(DE-He213)978-981-16-5101-4(EXLCZ)992116781070004120220209d2022 u| 0engurcnu||||||||txtrdacontentcrdamediacrrdacarrierElectron Microscopy in Science and Engineering /edited by Krishanu Biswas, Sri Sivakumar, Nilesh Gurao1st ed. 2022.Singapore :Springer Nature Singapore :Imprint: Springer,2022.1 online resource (153 pages)IITK Directions,2509-6605 ;6Print version: Biswas, Krishanu Electron Microscopy in Science and Engineering Singapore : Springer Singapore Pte. Limited,c2022 9789811651007 Small scale deformation experiments inside an SEM -- In-situ Micromechanical Testing in Scanning Electron Microscopy -- Exploring Carbon Surface using Electron Microscopy: Applications to Energy, Environment and Health -- Electron Backscatter Diffraction Technique: Fundamentals to Applications -- Application of Electron backscatter diffraction (EBSD) method in Earth Sciences -- Electron Probe Micro-Analyser: An Equipment for Accurate and Precise Micro-Composition Analysis.This issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute.IITK Directions,2509-6605 ;6MaterialsSpectrum analysisBuilding materialsMaterials EngineeringSpectroscopyStructural MaterialsMaterials.Spectrum analysis.Building materials.Materials Engineering.Spectroscopy.Structural Materials.502.825Biswas Krishanu1198535Sivakumar SriGurao NileshMiAaPQMiAaPQMiAaPQBOOK9910743354603321Electron microscopy in science and engineering3559299UNINA