LEADER 03234nam 22006375 450 001 9910743354603321 005 20251113180956.0 010 $a981-16-5101-9 010 $a981-16-5100-0 010 $a981-16-5101-9 024 7 $a10.1007/978-981-16-5101-4 035 $a(MiAaPQ)EBC6885916 035 $a(Au-PeEL)EBL6885916 035 $a(CKB)21167810700041 035 $a(PPN)260828904 035 $a(OCoLC)1296677199 035 $a(DE-He213)978-981-16-5101-4 035 $a(EXLCZ)9921167810700041 100 $a20220209d2022 u| 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aElectron Microscopy in Science and Engineering /$fedited by Krishanu Biswas, Sri Sivakumar, Nilesh Gurao 205 $a1st ed. 2022. 210 1$aSingapore :$cSpringer Nature Singapore :$cImprint: Springer,$d2022. 215 $a1 online resource (153 pages) 225 1 $aIITK Directions,$x2509-6605 ;$v6 311 08$aPrint version: Biswas, Krishanu Electron Microscopy in Science and Engineering Singapore : Springer Singapore Pte. Limited,c2022 9789811651007 327 $aSmall scale deformation experiments inside an SEM -- In-situ Micromechanical Testing in Scanning Electron Microscopy -- Exploring Carbon Surface using Electron Microscopy: Applications to Energy, Environment and Health -- Electron Backscatter Diffraction Technique: Fundamentals to Applications -- Application of Electron backscatter diffraction (EBSD) method in Earth Sciences -- Electron Probe Micro-Analyser: An Equipment for Accurate and Precise Micro-Composition Analysis. 330 $aThis issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well as technological research. The content written by leading experts is intended to provide the capabilities of EM facilities, set at Indian Institute of Technology (IIT) Kanpur to solve various problems and caters to the needs of both internal and external users. The book provides a detailed and comprehensive viewpoint of the basic features and advanced capabilities of EM facilities to the scientific community. A large number of electron microscopes have been installed and utilized by researchers across various engineering and science departments; hence, this volume provides both breadth as well as depth of various EM facilities available at the institute. 410 0$aIITK Directions,$x2509-6605 ;$v6 606 $aMaterials 606 $aSpectrum analysis 606 $aBuilding materials 606 $aMaterials Engineering 606 $aSpectroscopy 606 $aStructural Materials 615 0$aMaterials. 615 0$aSpectrum analysis. 615 0$aBuilding materials. 615 14$aMaterials Engineering. 615 24$aSpectroscopy. 615 24$aStructural Materials. 676 $a502.825 700 $aBiswas$b Krishanu$01198535 702 $aSivakumar$b Sri 702 $aGurao$b Nilesh 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910743354603321 996 $aElectron microscopy in science and engineering$93559299 997 $aUNINA