Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / / edited by Yichuang Sun

• Pubblicazione: London, : Institution of Engineering and Technology, 2008
• Descrizione fisica: 1 online resource (411 p.)
• Disciplina: 621.38150287
• Soggetto topico: Linear integrated circuits - Testing; Mixed signal circuits - Testing; Radio frequency integrated circuits - Testing
• Altri autori: SunYichuang
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Contents; Preface; List of contributors; 1 Fault diagnosis of linear and non-linear analogue circuits; 2 Symbolic function approaches for analogue fault diagnosis 37Stefano Manetti and Maria Cristina Piccirilli; 3 Neural-network-based approaches for analogue circuit faultdiagnosis; 4 Hierarchical/decomposition techniques for large-scale analoguediagnosis; 5 DFT and BIST techniques for analogue and mixed-signal test; 6 Design-for-testability of analogue filters; 7 Test of A/D converters: From converter characteristics to built-inself-test proposals; 8 Test of Sigma Delta converters ; 9 Phase-locked loop test methodologies: Current characterization and production test practices10 On-chip testing techniques for RF wireless transceiver systemsand components; 11 Tuning and calibration of analogue, mixed-signal and RF circuits; Index
• Sommario/riassunto: This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source.
• Titolo autorizzato: Test and diagnosis of analogue, mixed-signal and RF integrated circuits
• ISBN: 1-281-97130-8; 9786611971304; 1-61583-315-3; 0-86341-999-2
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9911006603503321
• Lo trovi qui: Univ. Federico II
• Serie: IET circuits, devices and systems series ; ; 19.