03051nam 2200625Ia 450 991100660350332120200520144314.01-281-97130-897866119713041-61583-315-30-86341-999-2(CKB)1000000000692760(EBL)407982(OCoLC)456124034(SSID)ssj0000311255(PQKBManifestationID)11265847(PQKBTitleCode)TC0000311255(PQKBWorkID)10315195(PQKB)10722839(MiAaPQ)EBC407982(EXLCZ)99100000000069276020071025d2008 uy 0engur|n|---|||||txtccrTest and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach /edited by Yichuang SunLondon Institution of Engineering and Technology20081 online resource (411 p.)Circuits, devices and systems series ;19Description based upon print version of record.0-86341-745-0 Includes bibliographical references and index.Contents; Preface; List of contributors; 1 Fault diagnosis of linear and non-linear analogue circuits; 2 Symbolic function approaches for analogue fault diagnosis 37Stefano Manetti and Maria Cristina Piccirilli; 3 Neural-network-based approaches for analogue circuit faultdiagnosis; 4 Hierarchical/decomposition techniques for large-scale analoguediagnosis; 5 DFT and BIST techniques for analogue and mixed-signal test; 6 Design-for-testability of analogue filters; 7 Test of A/D converters: From converter characteristics to built-inself-test proposals; 8 Test of Sigma Delta converters9 Phase-locked loop test methodologies: Current characterization and production test practices10 On-chip testing techniques for RF wireless transceiver systemsand components; 11 Tuning and calibration of analogue, mixed-signal and RF circuits; IndexThis book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source.IET circuits, devices and systems series ;19.Linear integrated circuitsTestingMixed signal circuitsTestingRadio frequency integrated circuitsTestingLinear integrated circuitsTesting.Mixed signal circuitsTesting.Radio frequency integrated circuitsTesting.621.38150287621.38150287Sun Yichuang1821740Institution of Engineering and Technology.MiAaPQMiAaPQMiAaPQBOOK9911006603503321Test and diagnosis of analogue, mixed-signal and RF integrated circuits4387579UNINA