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[null,"1.","Record Nr.",null,"UNINA9911006603503321"]
[null,null,"Titolo",null,"Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / / edited by Yichuang Sun"]
[null,null,"Pubbl/distr/stampa",null,"London, : Institution of Engineering and Technology, 2008"]
[null,null,"ISBN",null,"1-281-97130-8"]
[{"$nulls":4},"9786611971304"]
[{"$nulls":4},"1-61583-315-3"]
[{"$nulls":4},"0-86341-999-2"]
[null,null,"Descrizione fisica",null,"1 online resource (411 p.)"]
[null,null,"Collana",null,"Circuits, devices and systems series ; ; 19"]
[null,null,"Disciplina",null,"621.38150287"]
[null,null,"Soggetti",null,"Linear integrated circuits - Testing"]
[{"$nulls":4},"Mixed signal circuits - Testing"]
[{"$nulls":4},"Radio frequency integrated circuits - Testing"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"Contents; Preface; List of contributors; 1 Fault diagnosis of linear and non-linear analogue circuits; 2 Symbolic function approaches for analogue fault diagnosis 37Stefano Manetti and Maria Cristina Piccirilli; 3 Neural-network-based approaches for analogue circuit faultdiagnosis; 4 Hierarchical/decomposition techniques for large-scale analoguediagnosis; 5 DFT and BIST techniques for analogue and mixed-signal test; 6 Design-for-testability of analogue filters; 7 Test of A/D converters: From converter characteristics to built-inself-test proposals; 8 Test of Sigma Delta converters"]
[{"$nulls":4},"9 Phase-locked loop test methodologies: Current characterization and production test practices10 On-chip testing techniques for RF wireless transceiver systemsand components; 11 Tuning and calibration of analogue, mixed-signal and RF circuits; Index"]
[null,null,null,"Sommario/riassunto","This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source."]