LEADER 03051nam 2200625Ia 450 001 9911006603503321 005 20200520144314.0 010 $a1-281-97130-8 010 $a9786611971304 010 $a1-61583-315-3 010 $a0-86341-999-2 035 $a(CKB)1000000000692760 035 $a(EBL)407982 035 $a(OCoLC)456124034 035 $a(SSID)ssj0000311255 035 $a(PQKBManifestationID)11265847 035 $a(PQKBTitleCode)TC0000311255 035 $a(PQKBWorkID)10315195 035 $a(PQKB)10722839 035 $a(MiAaPQ)EBC407982 035 $a(EXLCZ)991000000000692760 100 $a20071025d2008 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aTest and diagnosis of analogue, mixed-signal and RF integrated circuits $ethe system on chip approach /$fedited by Yichuang Sun 210 $aLondon $cInstitution of Engineering and Technology$d2008 215 $a1 online resource (411 p.) 225 1 $aCircuits, devices and systems series ;$v19 300 $aDescription based upon print version of record. 311 $a0-86341-745-0 320 $aIncludes bibliographical references and index. 327 $aContents; Preface; List of contributors; 1 Fault diagnosis of linear and non-linear analogue circuits; 2 Symbolic function approaches for analogue fault diagnosis 37Stefano Manetti and Maria Cristina Piccirilli; 3 Neural-network-based approaches for analogue circuit faultdiagnosis; 4 Hierarchical/decomposition techniques for large-scale analoguediagnosis; 5 DFT and BIST techniques for analogue and mixed-signal test; 6 Design-for-testability of analogue filters; 7 Test of A/D converters: From converter characteristics to built-inself-test proposals; 8 Test of Sigma Delta converters 327 $a9 Phase-locked loop test methodologies: Current characterization and production test practices10 On-chip testing techniques for RF wireless transceiver systemsand components; 11 Tuning and calibration of analogue, mixed-signal and RF circuits; Index 330 $aThis book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. 410 0$aIET circuits, devices and systems series ;$v19. 606 $aLinear integrated circuits$xTesting 606 $aMixed signal circuits$xTesting 606 $aRadio frequency integrated circuits$xTesting 615 0$aLinear integrated circuits$xTesting. 615 0$aMixed signal circuits$xTesting. 615 0$aRadio frequency integrated circuits$xTesting. 676 $a621.38150287 676 $a621.38150287 701 $aSun$b Yichuang$01821740 712 02$aInstitution of Engineering and Technology. 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911006603503321 996 $aTest and diagnosis of analogue, mixed-signal and RF integrated circuits$94387579 997 $aUNINA