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Surface and thin film analysis [[electronic resource] ] : a compendium of principles, instrumentation, and applications / / edited by Gernot Friedbacher and Henning Bubert



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Titolo: Surface and thin film analysis [[electronic resource] ] : a compendium of principles, instrumentation, and applications / / edited by Gernot Friedbacher and Henning Bubert Visualizza cluster
Pubblicazione: Weinheim, Germany, : Wiley-VCH, 2011
Edizione: 2nd ed.
Descrizione fisica: 1 online resource (559 p.)
Disciplina: 530.4275
541.33
Soggetto topico: Thin films - Surfaces - Analysis
Electron spectroscopy
Spectrum analysis
Pel·lícules fines
Espectroscòpia d'electrons
Soggetto genere / forma: Llibres electrònics
Altri autori: FriedbacherGernot  
BubertH (Henning)  
Note generali: Description based upon print version of record.
Nota di bibliografia: Includes bibliographical references and index.
Nota di contenuto: pt. 1. Electron detection -- pt. 2. Ion detection -- pt. 3. Photon detection -- pt. 4. Scanning probe microscopy.
Sommario/riassunto: Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid ref
Titolo autorizzato: Surface and thin film analysis  Visualizza cluster
ISBN: 1-283-14094-2
9786613140944
3-527-63694-3
3-527-63692-7
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910829931303321
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