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Titolo: |
Surface and thin film analysis [[electronic resource] ] : a compendium of principles, instrumentation, and applications / / edited by Gernot Friedbacher and Henning Bubert
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Pubblicazione: | Weinheim, Germany, : Wiley-VCH, 2011 |
Edizione: | 2nd ed. |
Descrizione fisica: | 1 online resource (559 p.) |
Disciplina: | 530.4275 |
541.33 | |
Soggetto topico: | Thin films - Surfaces - Analysis |
Electron spectroscopy | |
Spectrum analysis | |
Pel·lícules fines | |
Espectroscòpia d'electrons | |
Soggetto genere / forma: | Llibres electrònics |
Altri autori: |
FriedbacherGernot
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Note generali: | Description based upon print version of record. |
Nota di bibliografia: | Includes bibliographical references and index. |
Nota di contenuto: | pt. 1. Electron detection -- pt. 2. Ion detection -- pt. 3. Photon detection -- pt. 4. Scanning probe microscopy. |
Sommario/riassunto: | Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid ref |
Titolo autorizzato: | Surface and thin film analysis ![]() |
ISBN: | 1-283-14094-2 |
9786613140944 | |
3-527-63694-3 | |
3-527-63692-7 | |
Formato: | Materiale a stampa ![]() |
Livello bibliografico | Monografia |
Lingua di pubblicazione: | Inglese |
Record Nr.: | 9910829931303321 |
Lo trovi qui: | Univ. Federico II |
Opac: | Controlla la disponibilità qui |