{"text_format":"2","workbook":"xls","n_sheets":1,"sheets":["report2"],"not_rendered":{"charts":0,"images":0,"macros":0,"external_links":1,"defined_names":1,"comments":0,"pivot_tables":0},"unopened":[],"bounds":{"document_bytes":16777216,"sheet_cells":100000,"run_cost":"one","rows_first":2000,"rows_last":500,"rows_between":2000,"halvings":0,"cell_chars":16384,"cell_head_chars":4096},"cells_cut":0,"cells_raw":0,"read":"whole","date_system":"1900","formulas":"cached_only"}

{"sheet":"report2","index":0,"n_rows":24,"n_cols":5,"rows_kept":24,"cut":false,"hidden":false,"merged":[[0,2,0,3],[0,4,0,5],[1,2,1,3],[1,4,1,5],[2,2,2,3],[3,2,3,3],[7,2,7,3],[8,2,8,3],[9,2,9,3],[11,2,11,3],[17,2,17,3],[18,2,18,3],[22,2,22,3]],"flags":["formulas_cached_only"]}
[null,"1.","Record Nr.",null,"UNINA9910829931303321"]
[null,null,"Titolo",null,"Surface and thin film analysis [[electronic resource] ] : a compendium of principles, instrumentation, and applications / / edited by Gernot Friedbacher and Henning Bubert"]
[null,null,"Pubbl/distr/stampa",null,"Weinheim, Germany, : Wiley-VCH, 2011"]
[null,null,"ISBN",null,"1-283-14094-2"]
[{"$nulls":4},"9786613140944"]
[{"$nulls":4},"3-527-63694-3"]
[{"$nulls":4},"3-527-63692-7"]
[null,null,"Edizione",null,"[2nd ed.]"]
[null,null,"Descrizione fisica",null,"1 online resource (559 p.)"]
[null,null,"Disciplina",null,"530.4275"]
[{"$nulls":4},"541.33"]
[null,null,"Soggetti",null,"Thin films - Surfaces - Analysis"]
[{"$nulls":4},"Electron spectroscopy"]
[{"$nulls":4},"Spectrum analysis"]
[{"$nulls":4},"Pel·lícules fines"]
[{"$nulls":4},"Espectroscòpia d'electrons"]
[{"$nulls":4},"Llibres electrònics"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Description based upon print version of record."]
[null,null,null,"Nota di bibliografia","Includes bibliographical references and index."]
[null,null,"Nota di contenuto",null,"pt. 1. Electron detection -- pt. 2. Ion detection -- pt. 3. Photon detection -- pt. 4. Scanning probe microscopy."]
[null,null,null,"Sommario/riassunto","Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid ref"]