02736nam 2200661 a 450 991082993130332120220504100358.01-283-14094-297866131409443-527-63694-33-527-63692-7(CKB)3460000000003434(EBL)822727(SSID)ssj0000545047(PQKBManifestationID)11386019(PQKBTitleCode)TC0000545047(PQKBWorkID)10554464(PQKB)10592066(MiAaPQ)EBC822727(PPN)190187816(EXLCZ)99346000000000343420120111d2011 uy 0engur|n|---|||||txtccrSurface and thin film analysis[electronic resource] a compendium of principles, instrumentation, and applications /edited by Gernot Friedbacher and Henning Bubert2nd ed.Weinheim, Germany Wiley-VCH20111 online resource (559 p.)Description based upon print version of record.3-527-32047-4 Includes bibliographical references and index.pt. 1. Electron detection -- pt. 2. Ion detection -- pt. 3. Photon detection -- pt. 4. Scanning probe microscopy.Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid refThin filmsSurfacesAnalysisElectron spectroscopySpectrum analysisPel·lícules finesthubEspectroscòpia d'electronsthubLlibres electrònicsthubThin filmsSurfacesAnalysis.Electron spectroscopy.Spectrum analysis.Pel·lícules finesEspectroscòpia d'electrons530.4275541.33Friedbacher Gernot1635511Bubert H(Henning)903323MiAaPQMiAaPQMiAaPQBOOK9910829931303321Surface and thin film analysis3976339UNINA