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010   $a9786613140944
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100   $a20120111d2011      uy             0
101 0 $aeng
135   $aur|n|---|||||
181   $ctxt
182   $cc
183   $acr
200 00$aSurface and thin film analysis$b[electronic resource] $ea compendium of principles, instrumentation, and applications /$fedited by Gernot Friedbacher and Henning Bubert
205   $a2nd ed.
210   $aWeinheim, Germany $cWiley-VCH$d2011
215   $a1 online resource (559 p.)
300   $aDescription based upon print version of record.
311   $a3-527-32047-4 
320   $aIncludes bibliographical references and index.
327   $apt. 1. Electron detection -- pt. 2. Ion detection -- pt. 3. Photon detection -- pt. 4. Scanning probe microscopy.
330   $aSurveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid ref
606   $aThin films$xSurfaces$xAnalysis
606   $aElectron spectroscopy
606   $aSpectrum analysis
606   $aPel·lícules fines$2thub
606   $aEspectroscòpia d'electrons$2thub
608   $aLlibres electrònics$2thub
615  0$aThin films$xSurfaces$xAnalysis.
615  0$aElectron spectroscopy.
615  0$aSpectrum analysis.
615  7$aPel·lícules fines
615  7$aEspectroscòpia d'electrons
676   $a530.4275
676   $a541.33
701   $aFriedbacher$b Gernot$01635511
701   $aBubert$b H$g(Henning)$0903323
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910829931303321
996   $aSurface and thin film analysis$93976339
997   $aUNINA