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Development of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device (CCD) imagers : annual report, May 15, 1980 to May 14, 1981 / / G. P. Carver



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Autore: Carver G. P Visualizza persona
Titolo: Development of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device (CCD) imagers : annual report, May 15, 1980 to May 14, 1981 / / G. P. Carver Visualizza cluster
Pubblicazione: Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1981
Descrizione fisica: 1 online resource
Altri autori: CarverG. P  
Note generali: 1981.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Nota di bibliografia: Includes bibliographical references.
Altri titoli varianti: Development of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device
Titolo autorizzato: Development of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device (CCD) imagers  Visualizza cluster
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910710273603321
Lo trovi qui: Univ. Federico II
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