01634aam 2200385I 450 991071027360332120160121100809.0GOVPUB-C13-1713742864fc4c7fe73173fe34db402a(CKB)5470000002476549(OCoLC)935499891(EXLCZ)99547000000247654920160121d1981 ua 0engrdacontentrdamediardacarrierDevelopment of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device (CCD) imagers annual report, May 15, 1980 to May 14, 1981 /G. P. CarverGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,1981.1 online resourceNBSIR ;81-23191981.Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page.Includes bibliographical references.Development of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device Carver G. P1385516Carver G. P1385516United States.National Bureau of Standards.NBSNBSGPOBOOK9910710273603321Development of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device (CCD) imagers3478485UNINA