LEADER 01634aam  2200385I  450 
001 9910710273603321
005 20160121100809.0
024 8 $aGOVPUB-C13-1713742864fc4c7fe73173fe34db402a
035   $a(CKB)5470000002476549
035   $a(OCoLC)935499891
035   $a(EXLCZ)995470000002476549
100   $a20160121d1981      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aDevelopment of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device (CCD) imagers $eannual report, May 15, 1980 to May 14, 1981 /$fG. P. Carver
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1981.
215   $a1 online resource
225 1 $aNBSIR ;$v81-2319
300   $a1981.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aDevelopment of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device 
700   $aCarver$b G. P$01385516
701   $aCarver$b G. P$01385516
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710273603321
996   $aDevelopment of test structures for characterization of the fabrication and performance of radiation-hardened Charge-Coupled Device (CCD) imagers$93478485
997   $aUNINA