2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto

• Pubblicazione: [Place of publication not identified], : IEEE, 2001
• Soggetto topico: Semiconductors - Characterization - Statistical methods; Semiconductors - Measurement; Electrical & Computer Engineering; Electrical Engineering; Engineering & Applied Sciences
• Note generali: Bibliographic Level Mode of Issuance: Monograph
• Titolo autorizzato: 2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910872993803321
• Lo trovi qui: Univ. Federico II