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Record Nr. |
UNINA9910872993803321 |
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Titolo |
2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE, 2001 |
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Soggetti |
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Semiconductors - Characterization - Statistical methods |
Semiconductors - Measurement |
Electrical & Computer Engineering |
Electrical Engineering |
Engineering & Applied Sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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