01632oam 2200457zu 450 991087299380332120241212215142.0(CKB)111055184250232(SSID)ssj0000454484(PQKBManifestationID)12123526(PQKBTitleCode)TC0000454484(PQKBWorkID)10397936(PQKB)10451783(EXLCZ)9911105518425023220160829d2001 uy engtxtccr2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto[Place of publication not identified]IEEE2001Bibliographic Level Mode of Issuance: Monograph9780780366886 0780366883 SemiconductorsCharacterizationStatistical methodsCongressesSemiconductorsMeasurementCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCSemiconductorsCharacterizationStatistical methodsSemiconductorsMeasurementElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied SciencesIEEE Electron Devices SocietyInternational Workshop on Statistical MethodologyPQKBPROCEEDING99108729938033212001 6th International Workshop on Statistical Methodology : IWSM : June 10, 20012496026UNINA