LEADER 01632oam  2200457zu 450 
001 9910872993803321
005 20241212215142.0
035   $a(CKB)111055184250232
035   $a(SSID)ssj0000454484
035   $a(PQKBManifestationID)12123526
035   $a(PQKBTitleCode)TC0000454484
035   $a(PQKBWorkID)10397936
035   $a(PQKB)10451783
035   $a(EXLCZ)99111055184250232
100   $a20160829d2001      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto
210 31$a[Place of publication not identified]$cIEEE$d2001
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780780366886 
311 08$a0780366883 
606   $aSemiconductors$xCharacterization$xStatistical methods$vCongresses
606   $aSemiconductors$xMeasurement$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aSemiconductors$xCharacterization$xStatistical methods
615  0$aSemiconductors$xMeasurement
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
712 02$aIEEE Electron Devices Society
712 12$aInternational Workshop on Statistical Methodology
801  0$bPQKB
906   $aPROCEEDING
912   $a9910872993803321
996   $a2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001$92496026
997   $aUNINA