Memory Technology, Design and Testing, 1997: IEEE International Workshop on (MTDT '97)

• Pubblicazione: [Place of publication not identified], : IEEE Computer Society Press, 1997
• Disciplina: 621.39/732
• Soggetto topico: Semiconductor storage devices - Congresses - Testing; Random access memory - Congresses; Electrical & Computer Engineering; Engineering & Applied Sciences; Electrical Engineering
• Persona (resp. second.): RajsumanRochit; LombardiFabrizio; WikT
• Note generali: Bibliographic Level Mode of Issuance: Monograph
• Nota di contenuto: Matching memory to the power of personal computers / R. Foss -- A low-cost, high performance three-dimensional memory module technology / A. Glaser ... [et al.] -- High speed circuit techniques in a 150MHz 64M SDRAM / V. Lines ... [et al.] -- An analysis of (linked) addressed decoder faults / A. van de Goor, G. Gaydadjiev -- SRAM yield estimation in the early stage of the design cycle / V. Kim, T. Chen -- False write through and un-restored write electrical level fault models for SRAMs / R. Adams, E. Cooley -- A defect-tolerant DRAM employing a hierarchical redundancy scheme, built-in self-test and self-reconfiguration / D. Niggemeyer, J. Otterstedt, M. Redeker -- Formal verification of memory arrays using symbolic trajectory evaluation / M. Pandey, R. Bryant -- A product development flow with metrics for memory designs / S. Hegde, I. Pal, K. Rao -- A low-power high storage capacity structure for GaAs MESFET ROM / R. Kanan ... [et al.] -- Use of selective precharge for low-power on the match lines of content-addressable memories / C. Zukowski, S. Wang -- An open notation for memory tests / A. Offerman, A. van de Goor -- Testing memory modules in SRAM-based configurable FPGAs / W. Huang ... [et al.] -- Memory array testing through a scannable configuration / S. Yano, N. Ishiura -- A high-speed parallel sensing scheme for multi-level non-volatile memories / C. Calligaro ... [et al.].
• Titolo autorizzato: Memory Technology, Design and Testing, 1997: IEEE International Workshop on (MTDT '97)
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910872636003321
• Lo trovi qui: Univ. Federico II