2009 10th Latin American Test Workshop
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| Titolo: |
2009 10th Latin American Test Workshop
|
| Pubblicazione: | [Place of publication not identified], : IEEE, 2009 |
| Descrizione fisica: | 1 online resource (221 pages) |
| Disciplina: | 621.3810287 |
| Soggetto topico: | Electronic apparatus and appliances - Testing |
| Persona (resp. second.): | IEEE Staff |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Sommario/riassunto: | The stuck-open fault (SOF) is a difficult, hard failure mechanism unique to CMOS technology [1-3]. Its detection requires a specific 2-vector pair that examines each transistor in the logic gate for an open defect in its drain and/or source. This defect defies a guaranteed 100% detection. We will show that this mostly discarded failure mechanism is very relevant to modern ICs. Current leakage in nanoscale technologies influence significantly the behavior of this fault. |
| Titolo autorizzato: | 2009 10th Latin American Test Workshop |
| ISBN: | 9781509069293 |
| 1509069291 | |
| 9781424442065 | |
| 1424442060 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910138915303321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |