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[null,"1.","Record Nr.",null,"UNINA9910138915303321"]
[null,null,"Titolo",null,"2009 10th Latin American Test Workshop"]
[null,null,"Pubbl/distr/stampa",null,"[Place of publication not identified], : IEEE, 2009"]
[null,null,"ISBN",null,"9781509069293"]
[{"$nulls":4},"1509069291"]
[{"$nulls":4},"9781424442065"]
[{"$nulls":4},"1424442060"]
[null,null,"Descrizione fisica",null,"1 online resource (221 pages)"]
[null,null,"Disciplina",null,"621.3810287"]
[null,null,"Soggetti",null,"Electronic apparatus and appliances - Testing"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Note generali","Bibliographic Level Mode of Issuance: Monograph"]
[null,null,null,"Sommario/riassunto","The stuck-open fault (SOF) is a difficult, hard failure mechanism unique to CMOS technology [1-3]. Its detection requires a specific 2-vector pair that examines each transistor in the logic gate for an open defect in its drain and/or source. This defect defies a guaranteed 100% detection. We will show that this mostly discarded failure mechanism is very relevant to modern ICs. Current leakage in nanoscale technologies influence significantly the behavior of this fault."]